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JVCS. 2019; 1(1): 13-17 HIGH SPEED AND RELIABLE DOUBLE EDGE TRIGGERED D- FLIP-FLOP FOR MEMORY APPLICATIONS NGO TIEN HOA, MIROSLAV VOZNAK*.
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How to Cite this Article |
Pubmed Style NGO TIEN HOA, MIROSLAV VOZNAK. HIGH SPEED AND RELIABLE DOUBLE EDGE TRIGGERED D- FLIP-FLOP FOR MEMORY APPLICATIONS. JVCS. 2019; 1(1): 13-17. doi:10.31838/jvcs/01.01.04 Web Style NGO TIEN HOA, MIROSLAV VOZNAK. HIGH SPEED AND RELIABLE DOUBLE EDGE TRIGGERED D- FLIP-FLOP FOR MEMORY APPLICATIONS. http://www.vlsijournal.com/?mno=89710 [Access: February 29, 2020]. doi:10.31838/jvcs/01.01.04 AMA (American Medical Association) Style NGO TIEN HOA, MIROSLAV VOZNAK. HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS. JVCS. 2019; 1(1): 13-17. doi:10.31838/jvcs/01.01.04 Vancouver/ICMJE Style NGO TIEN HOA, MIROSLAV VOZNAK. HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS. JVCS. (2019), [cited February 29, 2020]; 1(1): 13-17. doi:10.31838/jvcs/01.01.04 Harvard Style NGO TIEN HOA, MIROSLAV VOZNAK (2019) HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS. JVCS, 1 (1), 13-17. doi:10.31838/jvcs/01.01.04 Turabian Style NGO TIEN HOA, MIROSLAV VOZNAK. 2019. HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS. Journal Of VLSI Circuits And Systems, 1 (1), 13-17. doi:10.31838/jvcs/01.01.04 Chicago Style NGO TIEN HOA, MIROSLAV VOZNAK. "HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS." Journal Of VLSI Circuits And Systems 1 (2019), 13-17. doi:10.31838/jvcs/01.01.04 MLA (The Modern Language Association) Style NGO TIEN HOA, MIROSLAV VOZNAK. "HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS." Journal Of VLSI Circuits And Systems 1.1 (2019), 13-17. Print. doi:10.31838/jvcs/01.01.04 APA (American Psychological Association) Style NGO TIEN HOA, MIROSLAV VOZNAK (2019) HIGH SPEED AND RELIABLE DOUBLE EDGE
TRIGGERED D- FLIP-FLOP FOR MEMORY
APPLICATIONS. Journal Of VLSI Circuits And Systems, 1 (1), 13-17. doi:10.31838/jvcs/01.01.04 |